Misorientation Mapping for Visualization of Plastic Strain via Electron Back-scattered Diffraction
نویسندگان
چکیده
The ability to map elastic or plastic strain on a microstructural level is critical to understanding and controlling deformation in structural alloys and ceramics. Electron back-scattered diffraction (EBSD) and related techniques, such as electron channeling patterns, have been used with some success to measure the plastic strain around cracks in Fe-3Si single crystals [1], Cu single crystals [2], and Ni-based superalloys [3], among others. However, combining high spatial resolution with the strain sensitivity needed for characterizing the steep strain gradient ahead of a crack tip has been difficult. In this paper, we will discuss the use of misorientation mapping for visualizing plastic deformation at the micron length scale.
منابع مشابه
Misorientation mapping for visualization of plastic deformation via electron back-scattered diffraction.
The ability to map plastic deformation around high strain gradient microstructural features is central in studying phenomena such as fatigue and stress corrosion cracking. A method for the visualization of plastic deformation in electron back-scattered diffraction (EBSD) data has been developed and is described in this article. This technique is based on mapping the intragrain misorientation in...
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Electron backscatter diffraction (EBSD) has been used to examine the plastic deformation of an ex-service 316 austenitic stainless steel at 297K and 823K at strain rates 3.5x10 -3 s -1 – 4x10 -7 s -1 . The distribution of local misorientations was found to depend on the imposed plastic strain following a lognormal distribution at true strains < 0.1 and a gamma distribution at strains > 0.1. At ...
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Electron backscatter diffraction (EBSD) has been used to examine the plastic deformation of an ex-service 316 austenitic stainless steel at 297K and 823K at strain rates 3.5x10 -3 s -1 – 4x10 -7 s -1 . The distribution of local misorientations was found to depend on the imposed plastic strain following a lognormal distribution at true strains < 0.1 and a gamma distribution at strains > 0.1. At ...
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